Key Specifications:

• Measurement Range: Capable of measuring surfaces from nanometers to millimeters, accommodating a wide range of applications.

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• Resolution: Offers a height display resolution of 0.01 nm, ensuring precise detection of minute surface variations.

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• Scanning Area: Supports scanning areas up to 50 × 50 mm (1.97' × 1.97'), allowing for comprehensive analysis of both small and large surface features.

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• Magnification: Provides magnification up to 28,800×, enabling detailed observation of surface textures and structures.

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• Measurement Speed: Achieves a maximum laser measurement speed of 125 Hz for surface scans and 7,900 Hz for line scans, facilitating efficient data acquisition.

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• Laser Specifications:

  • VK-X3100: Semiconductor laser with a wavelength of 404 nm.

  • VK-X3050: Semiconductor laser with a wavelength of 661 nm. Keyence

• Laser Output: Maximum laser output of 1.0 mW, classified as a Class 2 Laser Product (IEC60825-1, FDA (CDRH) Part 1040.10).

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• Optical Components:

  • 16-bit photomultiplier for laser light-receiving.

  • High-definition color CMOS for white light reception. Keyence

• Environmental Conditions:

  • Operating temperature: 15 to 28°C (59 to 82.4°F).

  • Relative humidity: 20 to 80% RH (no condensation). Keyence