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Key Specifications:
Measurement Range: Capable of measuring surfaces from nanometers to millimeters, accommodating a wide range of applications.
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Resolution: Offers a height display resolution of 0.01 nm, ensuring precise detection of minute surface variations.
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Scanning Area: Supports scanning areas up to 50 × 50 mm (1.97' × 1.97'), allowing for comprehensive analysis of both small and large surface features.
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Magnification: Provides magnification up to 28,800×, enabling detailed observation of surface textures and structures.
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Measurement Speed: Achieves a maximum laser measurement speed of 125 Hz for surface scans and 7,900 Hz for line scans, facilitating efficient data acquisition.
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Laser Specifications:
VK-X3100: Semiconductor laser with a wavelength of 404 nm.
VK-X3050: Semiconductor laser with a wavelength of 661 nm. Keyence
Laser Output: Maximum laser output of 1.0 mW, classified as a Class 2 Laser Product (IEC60825-1, FDA (CDRH) Part 1040.10).
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Optical Components:
16-bit photomultiplier for laser light-receiving.
High-definition color CMOS for white light reception. Keyence
Environmental Conditions:
Operating temperature: 15 to 28°C (59 to 82.4°F).
Relative humidity: 20 to 80% RH (no condensation). Keyence
